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Impact of resistive paths on NVM array reliability: Application to Flash & ReRAM memories.

Pierre CanetJérémy Postel-PellerinHassen Aziza
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • information systems
  • shortest path
  • key technologies
  • reliability analysis
  • databases
  • real world
  • image segmentation
  • image sequences
  • multiscale
  • objective function
  • data model