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Resistive RAM SET and RESET Switching Voltage Evaluation as an Entropy Source for Random Number Generation.

Hussein BazziJérémy Postel-PellerinHassen AzizaMathieu MoreauAdnan Harb
Published in: DFT (2020)
Keyphrases
  • random number
  • small number
  • learning algorithm
  • data structure
  • power consumption
  • evaluation method