Hanzhi Xun

Publication Activity (10 Years)

Years Active: 2023-2024
Publications (10 Years): 9

Top Topics

Statistical Significance

Built In Self Test

Defect Detection

Top Venues

Publications

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Diagnosis for Yield Learning in RRAMs. DATE (2024)
Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui
Design-for-Test for Intermittent Faults in STT-MRAMs. ETS (2024)
Hassen Aziza, Jérémy Postel-Pellerin, Moritz Fieback, Said Hamdioui, Hanzhi Xun, Mottaqiallah Taouil, Karine Coulié, Wenceslas Rahajandraibe
Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing. LATS (2024)
Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Online Detection of Unique Faults in RRAMs. ETS (2024)
Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui
Characterization and Test of Intermittent Over RESET in RRAMs. ATS (2023)
Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui
Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs. ETS (2023)
Sicong Yuan, Z. Zhang, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, M. Taouil, Said Hamdioui
Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs. ITC (2023)
Hanzhi Xun, Sicong Yuan, Moritz Fieback, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui
Device-Aware Test for Ion Depletion Defects in RRAMs. ITC (2023)
Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui
Device-Aware Test for Back-Hopping Defects in STT-MRAMs. DATE (2023)