Device-Aware Test for Ion Depletion Defects in RRAMs.

Hanzhi Xun Sicong Yuan Moritz Fieback Hassen Aziza Mottaqiallah Taouil Said Hamdioui

Published in: ITC (2023)

Keyphrases

database
neural network
computer vision
image processing
decision trees
test data
quality control
defect detection