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Design-for-Test for Intermittent Faults in STT-MRAMs.

Sicong YuanMohammad Amin YaldagardHanzhi XunMoritz FiebackErik Jan MarinissenWoojin KimSiddharth RaoSebastien CouetMottaqiallah TaouilSaid Hamdioui
Published in: ETS (2024)
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