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Device-Aware Test for Back-Hopping Defects in STT-MRAMs.

Sicong YuanMottaqiallah TaouilMoritz FiebackHanzhi XunErik Jan MarinissenGouri Sankar KarSidharth RaoSebastien CouetSaid Hamdioui
Published in: DATE (2023)
Keyphrases
  • computer vision
  • image processing
  • real time
  • data sets
  • digital images
  • neural network
  • expert systems