Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs.
Hanzhi XunMoritz FiebackSicong YuanZiwei ZhangMottaqiallah TaouilSaid HamdiouiPublished in: ETS (2023)
Keyphrases
- data sets
- background information
- database
- probability distribution
- case study
- input data
- data objects
- data analysis
- prior knowledge
- knowledge discovery
- image data
- small number
- synthetic data
- statistical analysis
- databases
- test data
- data distribution
- experimental data
- data collection
- data processing
- high speed
- high dimensional data
- test cases
- missing data
- knowledge base
- data sources
- xml documents
- raw data
- original data
- high quality
- complex data
- statistical significance
- decision trees