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Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs.
Sicong Yuan
Z. Zhang
Moritz Fieback
Hanzhi Xun
Erik Jan Marinissen
Gouri Sankar Kar
Sidharth Rao
Sebastien Couet
M. Taouil
Said Hamdioui
Published in:
ITC (2023)
Keyphrases
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high speed
information processing
design principles
low power
rapid development
data mining
case study
software engineering
knowledge based systems
development process
machine vision
design considerations
defect detection