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Investigation of Single Event Effects in a Resistive RAM Memory Array by Coupling TCAD and SPICE Simulations.
Karine Coulié
Hassen Aziza
Wenceslas Rahajandraibe
Published in:
J. Electron. Test. (2023)
Keyphrases
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random access memory
main memory
event detection
database systems
memory usage
social networks
computer vision
numerical simulations
computational power
computer aided design
random access
limited memory
memory access