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Resistive RAM variability monitoring using a ring oscillator based test chip.

Hassen AzizaJean-Michel Portal
Published in: Microelectron. Reliab. (2016)
Keyphrases
  • high speed
  • low cost
  • real time
  • monitoring system
  • high density
  • random access memory
  • differential equations
  • b tree
  • statistical significance
  • feedback loop
  • physical design
  • vlsi implementation
  • analog vlsi