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Defect and Fault Modeling Framework for STT-MRAM Testing.

Lizhou WuSiddharth RaoMottaqiallah TaouilGuilherme Cardoso MedeirosMoritz FiebackErik Jan MarinissenGouri Sankar KarSaid Hamdioui
Published in: IEEE Trans. Emerg. Top. Comput. (2021)
Keyphrases
  • modeling framework
  • fault model
  • design considerations
  • topic modeling
  • fault diagnosis
  • fault detection
  • educational technology
  • real world
  • machine learning
  • em algorithm
  • image classification
  • text classification