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Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT.
Abhairaj Singh
Moritz Fieback
Rajendra Bishnoi
Filip Bradaric
Anteneh Gebregiorgis
Rajiv V. Joshi
Said Hamdioui
Published in:
ITC (2022)
Keyphrases
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low cost
real time
hardware and software
neural network
computational complexity
test cases
highly efficient
low power
test generation
discrete fourier transform
software testing
test suite
fourier transform
data acquisition
test set
multiresolution
learning algorithm