Rudolf Ullmann

Publication Activity (10 Years)

Years Active: 2014-2023
Publications (10 Years): 5

Top Topics

Lossless Data Compression

Industrial Environment

Top Venues

Publications

Giorgio Insinga, M. Battilana, M. Coppetta, N. Mautone, G. Carnevale, M. Giltrelli, P. Scaramuzza, Rudolf Ullmann
Density-oriented diagnostic data compression strategy for characterization of embedded memories in Automotive Systems-on-Chip. ETS (2023)
Paolo Bernardi, G. Insinga, G. Paganini, Riccardo Cantoro, P. Beer, M. Coppetta, N. Mautone, G. Carnevale, P. Scaramuzza, Rudolf Ullmann
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip. ETS (2022)
Paolo Bernardi, Riccardo Cantoro, Anthony Coyette, W. Dobbeleare, Moritz Fieback, Andrea Floridia, G. Gielenk, J. Gomez, Michelangelo Grosso, Andrea Guerriero, I. Guglielminetti, Said Hamdioui, G. Insinga, N. Mautone, Nunzio Mirabella, Sandro Sartoni, Matteo Sonza Reorda, Rudolf Ullmann, Ronny Vanhooren, N. Xamak, Lizhou Wu
Recent Trends and Perspectives on Defect-Oriented Testing. IOLTS (2022)
A. Manzini, P. Inglese, L. Caldi, R. Cantero, G. Carnevale, M. Coppetta, M. Giltrelli, N. Mautone, F. Irrera, Rudolf Ullmann, Paolo Bernardi
A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip. ETS (2019)
Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner
Robustness in automotive electronics: An industrial overview of major concerns. IOLTS (2017)
Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase
Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. ITC (2014)