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Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening.
Andreas Kux
Rudolf Ullmann
Thomas Kern
Roland Strunz
Hanno Melzner
Stephan Beuven
Andreas Haase
Published in:
ITC (2014)
Keyphrases
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defect detection
feature extraction
data acquisition
low cost
automated visual inspection
outlier detection
database
information systems
image processing
image analysis
latent variables
embedded systems
watermarking algorithm
design considerations
drug discovery