A Machine Learning-based Approach to Optimize Repair and Increase Yield of Embedded Flash Memories in Automotive Systems-on-Chip.
A. ManziniP. IngleseL. CaldiR. CanteroG. CarnevaleM. CoppettaM. GiltrelliN. MautoneF. IrreraRudolf UllmannPaolo BernardiPublished in: ETS (2019)
Keyphrases
- machine learning
- learning systems
- pattern recognition
- intelligent systems
- data mining
- neural network
- inductive logic programming
- information extraction
- machine learning systems
- machine learning approaches
- complex systems
- computational intelligence
- active learning
- database systems
- artificial intelligence
- high speed
- knowledge acquisition
- management system
- learning tasks
- decision trees
- embedded systems
- digital circuits
- learning algorithm