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Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs.

Lizhou WuSiddharth RaoMottaqiallah TaouilErik Jan MarinissenGouri Sankar KarSaid Hamdioui
Published in: ITC (2020)
Keyphrases
  • data structure
  • databases
  • test cases
  • database
  • learning algorithm
  • decision trees
  • case study
  • similarity measure
  • multi agent
  • wide range
  • search algorithm
  • multiresolution
  • defect detection
  • location prediction