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Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs.
Lizhou Wu
Siddharth Rao
Mottaqiallah Taouil
Erik Jan Marinissen
Gouri Sankar Kar
Said Hamdioui
Published in:
IEEE Trans. Computers (2022)
Keyphrases
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databases
data sets
neural network
search algorithm
markov chain
test data
state variables