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Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.

Thiago CopettiGuilherme Cardoso MedeirosMottaqiallah TaouilSaid HamdiouiLetícia Maria Bolzani PoehlsTiago Roberto Balen
Published in: J. Electron. Test. (2021)
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