On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations.
Sonia BendhiaAlexandre BoyerBertrand VrignonMikaël DeobarroThanh Vinh DinhPublished in: IEEE Trans. Instrum. Meas. (2012)
Keyphrases
- integrated circuit
- sensor noise
- printed circuit boards
- high speed
- metal oxide semiconductor
- sensor data
- sensor networks
- built in self test
- wide band
- noisy data
- electron beam
- noise level
- real time
- signal to noise ratio
- image sensor
- missing data
- low cost
- multi sensor
- digital camera
- analog vlsi
- hardware description language
- wireless sensor networks