Sonia Bendhia

Publication Activity (10 Years)

Years Active: 2010-2015
Publications (10 Years): 0

Top Topics

Integrated Circuit

Metal Oxide Semiconductor

Top Venues

Microelectron. Reliab.

IEEE Trans. Instrum. Meas.

Publications

He Huang, Alexandre Boyer, Sonia Bendhia
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter. Microelectron. Reliab. 55 (9-10) (2015)
Jianfei Wu, Alexandre Boyer, Jiancheng Li, Sonia Bendhia, Bertrand Vrignon
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing. Microelectron. Reliab. 53 (9-11) (2013)
Sonia Bendhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro, Thanh Vinh Dinh
On-Chip Noise Sensor for Integrated Circuit Susceptibility Investigations. IEEE Trans. Instrum. Meas. 61 (3) (2012)
Raúl Fernández-García, Ignacio Gil, Alexandre Boyer, Sonia Bendhia, Bertrand Vrignon
A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior. IEICE Trans. Electron. (12) (2011)
B. Li, N. Berbel, Alexandre Boyer, Sonia Bendhia, Raúl Fernández-García
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences. Microelectron. Reliab. 51 (9-11) (2011)
N. Berbel, Raúl Fernández-García, Ignacio Gil, B. Li, Alexandre Boyer, Sonia Bendhia
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout. Microelectron. Reliab. 51 (9-11) (2011)
B. Li, Alexandre Boyer, Sonia Bendhia, C. Lemoine
Ageing effect on electromagnetic susceptibility of a phase locked loop. Microelectron. Reliab. 50 (9-11) (2010)