Login / Signup
A New Approach to Modeling the Impact of EMI on MOSFET DC Behavior.
Raúl Fernández-García
Ignacio Gil
Alexandre Boyer
Sonia Bendhia
Bertrand Vrignon
Published in:
IEICE Trans. Electron. (2011)
Keyphrases
</>
neural network
learning bayesian networks
high impact
data sets
information retrieval
genetic algorithm
database systems
image sequences
expert systems
modeling language
modeling framework
factors that influence
behavioral models