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Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.

N. BerbelRaúl Fernández-GarcíaIgnacio GilB. LiAlexandre BoyerSonia Bendhia
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • power law
  • computational model
  • neural network
  • probability distribution
  • mathematical model
  • statistical model
  • scale free
  • similarity measure
  • management system
  • learning curves