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LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing.

Jianfei WuAlexandre BoyerJiancheng LiSonia BendhiaBertrand Vrignon
Published in: Microelectron. Reliab. (2013)
Keyphrases
  • prediction accuracy
  • steady state
  • closed loop
  • prediction model
  • prediction algorithm
  • data sets
  • neural network
  • power grid