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A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level.

Jaume SeguraCarol de BenitoAntonio RubioCharles F. Hawkins
Published in: ITC (1995)
Keyphrases
  • data analysis
  • statistical analysis
  • high level
  • medical images
  • quantitative analysis
  • real world
  • multiresolution
  • low level
  • high speed