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Unknown-tolerance analysis and test-quality control for test response compaction using space compactors.

Mango Chia-Tso ChaoKwang-Ting ChengSeongmoon WangSrimat T. ChakradharWenlong Wei
Published in: DAC (2006)
Keyphrases
  • quality control
  • neural network
  • machine vision
  • manufacturing systems
  • quality assurance
  • data mining
  • genetic algorithm
  • low dimensional
  • database
  • machine learning
  • case study
  • cooperative
  • statistical tests