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A scalable scan-path test point insertion technique to enhance delay fault coverage for standard scan designs.
Seongmoon Wang
Srimat T. Chakradhar
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
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scan path
eye movements
usability testing
eye tracking
real time
object recognition
computer graphics
eye tracking data
levenshtein distance