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Zero Cost Test Point Insertion Technique for Structured ASICs.

Rajamani SethuramSeongmoon WangSrimat T. ChakradharMichael L. Bushnell
Published in: VLSI Design (2007)
Keyphrases
  • total cost
  • expected cost
  • data sets
  • test cases
  • high cost
  • real world
  • machine learning
  • genetic algorithm
  • software engineering
  • general purpose
  • structured data
  • cost reduction