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Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test Sets.
Seongmoon Wang
Xiao Liu
Srimat T. Chakradhar
Published in:
DATE (2004)
Keyphrases
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test set
test data
test cases
error rate
real time
hardware and software
scan data
computer systems
random selection
decision trees
training data
training set
control system
significantly lower
low power consumption