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A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support.
Seongmoon Wang
Wenlong Wei
Zhanglei Wang
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2010)
Keyphrases
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low overhead
similarity measure
anomaly detection
pattern matching
real time
clustering algorithm
data structure
digital libraries
data analysis
pairwise
probabilistic model