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An automatic test pattern generator for minimizing switching activity during scan testing activity.
Seongmoon Wang
Sandeep K. Gupta
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2002)
Keyphrases
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pattern generator
test data
data sets
multi modal
test cases
human activities
learning algorithm
test sequences
real time
genetic algorithm
spatio temporal
semi automatic
regression testing
activity patterns
model based testing