Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics.

Zhanglei Wang Krishnendu Chakrabarty

Published in: J. Electron. Test. (2007)

Keyphrases

built in self test
integrated circuit
electrical engineering
defect detection
three dimensional
molecular dynamics
neural network
case study
drug discovery
feature extraction
van der waals
artificial neural networks
image processing
knowledge base
feature selection
information systems
genetic algorithm