Lei Li

Publication Activity (10 Years)

Years Active: 2003-2007
Publications (10 Years): 0

Publications

Lei Li, Zhanglei Wang, Krishnendu Chakrabarty
Scan-BIST based on cluster analysis and the encoding of repeating sequences. ACM Trans. Design Autom. Electr. Syst. 12 (1) (2007)
Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty
Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC (2005)
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Shivakumar Swaminathan
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores. VLSI Design (2005)
Lei Li, Krishnendu Chakrabarty
Hybrid BIST Based on Repeating Sequences and Cluster Analysis. DATE (2005)
Lei Li, Krishnendu Chakrabarty
Test set embedding for deterministic BIST using a reconfigurable interconnection network. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23 (9) (2004)
Lei Li, Krishnendu Chakrabarty
On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression. J. Electron. Test. 20 (6) (2004)
Lei Li, Krishnendu Chakrabarty, Nur A. Touba
Test data compression using dictionaries with selective entries and fixed-length indices. ACM Trans. Design Autom. Electr. Syst. 8 (4) (2003)
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Chakrabarty
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume. ICCD (2003)
Lei Li, Krishnendu Chakrabarty
Test Data Compression Using Dictionaries with Fixed-Length Indices. VTS (2003)
Lei Li, Krishnendu Chakrabarty
Deterministic BIST Based on a Reconfigurable Interconnection Network. ITC (2003)