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On Using Exponential-Golomb Codes and Subexponential Codes for System-on-a-Chip Test Data Compression.

Lei LiKrishnendu Chakrabarty
Published in: J. Electron. Test. (2004)
Keyphrases
  • test data
  • training data
  • test cases
  • test set
  • search based testing
  • data sets
  • lossless compression
  • database
  • compression ratio
  • data mining
  • machine learning
  • learning algorithm
  • high resolution
  • object oriented