Scan-BIST based on cluster analysis and the encoding of repeating sequences.
Lei LiZhanglei WangKrishnendu ChakrabartyPublished in: ACM Trans. Design Autom. Electr. Syst. (2007)
Keyphrases
- cluster analysis
- categorical data
- clustering method
- data clustering
- factor analysis
- data mining techniques
- hierarchical latent class models
- clustering analysis
- unsupervised learning
- k means
- data mining
- data analysis
- clustering algorithm
- fuzzy clustering
- neural gas
- partitional clustering
- cluster validity
- multidimensional scaling
- correlation analysis
- data sets
- association analysis
- computer vision
- databases
- real world
- fuzzy c means
- training data
- latent class models
- knowledge discovery