LATENT CLASS MODELS
Experts
- Nevin Lianwen Zhang
- Herna L. Viktor
- Paulo Salvador
- Rui Valadas
- Richard G. Lawson
- Suleyman Cetintas
- Maria Rosário de Oliveira
- Eric Paquet
- Shoji Hirano
- Sehun Kim
- Antonio Forcina
- Jingdong Jia
- Hanlin Mo
- Luiz Fernando Capretz
- Eduardo R. Hruschka
- Jeroen K. Vermunt
- Akira Asano
- Natalia V. Andrienko
- Hans-Georg Bartel
- Jesús Bobadilla
- Shusaku Tsumoto
- Xin Zhao
- António Pacheco
- Tomás Kocka
- Luo Si
- Hans-Joachim Mucha
- Gennady L. Andrienko
- Zupeng Chen
- Dereje W. Gudicha
- Peter C. Jurs
- Fetene B. Tekle
- Teng Wang
- Ligaj Pradhan
- Marah M. Aqeel
- D. K. Banwet
- Hideaki Nagahata
- Krishnendu Chakrabarty
- Kweku-Muata Osei-Bryson
- Georgios Evangelidis
Venues
- CoRR
- Expert Syst. Appl.
- J. Classif.
- GfKl
- IEEE Trans. Vis. Comput. Graph.
- Comput. Stat. Data Anal.
- Eur. J. Oper. Res.
- Pattern Recognit. Lett.
- EMBC
- Oper. Res.
- Ann. Oper. Res.
- ICIS
- Pattern Recognit.
- J. Chem. Inf. Comput. Sci.
- Adv. Data Anal. Classif.
- Sensors
- ICONIP (3)
- WWW
- SIGIR
- EDUCON
- Int. J. Electron. Commer.
- IV
- Stat. Comput.
- ICDM
- Stat. Methods Appl.
- KDD
- J. Am. Soc. Inf. Sci.
- IJCAI
- BIBM
- Int. J. Fuzzy Syst.
- FLAIRS Conference
- Inf. Manag.
- ADMA
- AMIA
- AISTATS
- WSDM
- FUZZ-IEEE
- Online Inf. Rev.
- BIS (Workshops)
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