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Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns.

Zhanglei WangKrishnendu Chakrabarty
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)
Keyphrases
  • test cases
  • neural network
  • information retrieval
  • statistical tests
  • quality assessment
  • data sets
  • knowledge base
  • training data
  • optimization algorithm
  • pattern mining
  • test suite