A Seed-Selection Method to Increase Defect Coverage for LFSR-Reseeding-Based Test Compression.
Zhanglei WangKrishnendu ChakrabartyMichael BienekPublished in: ETS (2007)
Keyphrases
- experimental evaluation
- preprocessing
- test data
- cost function
- significant improvement
- high accuracy
- dynamic programming
- image quality
- computationally efficient
- support vector machine svm
- neural network
- clustering method
- high precision
- detection algorithm
- feature set
- classification method
- seed selection
- model selection
- image compression
- signal processing
- high speed
- probabilistic model
- multiresolution
- feature vectors
- computational complexity
- image sequences