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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.

Elena I. VatajeluGeorgios TsiligiannisLuigi DililloAlberto BosioPatrick GirardSerge PravossoudovitchAida TodriArnaud VirazelFrederic WrobelFrédéric Saigné
Published in: DFTS (2013)
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