On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell.
Elena I. VatajeluGeorgios TsiligiannisLuigi DililloAlberto BosioPatrick GirardSerge PravossoudovitchAida TodriArnaud VirazelFrederic WrobelFrédéric SaignéPublished in: DFTS (2013)