Eric Faehn

Publication Activity (10 Years)

Years Active: 2012-2024
Publications (10 Years): 9

Top Topics

Synthetic Aperture Radar Images

Built In Self Test

Power Consumption

Failure Diagnosis

Top Venues

IEEE Trans. Circuits Syst. I Regul. Pap.

Publications

G. Mongelli, Xhesila Xhafa, Eric Faehn, D. Robins, P. Girard, Arnaud Virazel
A Graph-Based Methodology for Speeding up Cell-Aware Model Generation. IOLTS (2024)
Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory di Pendina, Patrick Girard, Arnaud Virazel
On Using Cell-Aware Methodology for SRAM Bit Cell Testing. ETS (2023)
Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos
Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs. VTS (2022)
Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos
Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure. ITC (2022)
Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos
BIST-Assisted Analog Fault Diagnosis. ETS (2021)
Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. Stratigopoulos
SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety. IEEE Trans. Circuits Syst. I Regul. Pap. 68 (6) (2021)
Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. D. Stratigopoulos
Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP. DATE (2020)
Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar
Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip. IOLTS (2019)
Tien-Phu Ho, Eric Faehn, Arnaud Virazel, Alberto Bosio, Patrick Girard
An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs. ITC (2018)
Jianbo Li, Yu Huang, Wu-Tung Cheng, Chris Schuermyer, Dong Xiang, Eric Faehn, Ruth Farrugia
A Hybrid Flow for Memory Failure Bitmap Classification. Asian Test Symposium (2012)