FAILURE DIAGNOSIS
Experts
- Ratnesh Kumar
- Feng Lin
- Stéphane Lafortune
- Shigemasa Takai
- Walter Murray Wonham
- Kai Cai
- Christoforos N. Hadjicostis
- Renyuan Zhang
- Shaolong Shu
- Krishnendu Chakrabarty
- Janusz Rajski
- Alessandro Giua
- Xiang Yin
- Karen Rudie
- Tomás Masopust
- Jun Chen
- Fuchun Liu
- Jan H. van Schuppen
- Khashayar Khorasani
- Krishna R. Pattipati
- João Carlos Basilio
- Franz Wotawa
- Jan Komenda
- Pabitra Mohan Khilar
- Weihua Li
- Daowen Qiu
- Rong Su
- Gianfranco Lamperti
- Zhiwu Li
- Jong-Myon Kim
- Zhongkui Zhu
- Carla Seatzu
- Lei Shu
- Philippe Dague
- Chuan Li
- Zhiwu Li
- Meir Kalech
- Marina Zanella
- Marcos Vicente Moreira
Venues
- IEEE Access
- IEEE Trans. Instrum. Meas.
- CoRR
- Sensors
- CDC
- IEEE Trans. Autom. Control.
- ACC
- Autom.
- IEEE Trans. Ind. Electron.
- Discret. Event Dyn. Syst.
- IEEE Trans. Ind. Informatics
- Expert Syst. Appl.
- Entropy
- Neurocomputing
- SMC
- ITC
- ECC
- IEEE Trans. Computers
- IEEE Trans Autom. Sci. Eng.
- Eng. Appl. Artif. Intell.
- CASE
- WODES
- IECON
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ETFA
- J. Intell. Fuzzy Syst.
- IEEE Trans. Control. Syst. Technol.
- Asian Test Symposium
- SAFEPROCESS
- Appl. Intell.
- I2MTC
- ICPHM
- ICRA
- IJCAI
- Int. J. Control
- Inf. Sci.
- DATE
- IEEE Trans. Fuzzy Syst.
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