FAILURE DIAGNOSIS
Experts
- Ratnesh Kumar
- Feng Lin
- Stéphane Lafortune
- Shigemasa Takai
- Walter Murray Wonham
- Kai Cai
- Christoforos N. Hadjicostis
- Renyuan Zhang
- Shaolong Shu
- Karen Rudie
- Xiang Yin
- Alessandro Giua
- Janusz Rajski
- Krishnendu Chakrabarty
- Tomás Masopust
- Jun Chen
- Fuchun Liu
- Jan H. van Schuppen
- Pabitra Mohan Khilar
- Krishna R. Pattipati
- Weihua Li
- Franz Wotawa
- Jan Komenda
- Khashayar Khorasani
- João Carlos Basilio
- Carla Seatzu
- Zhiwu Li
- Jong-Myon Kim
- Daowen Qiu
- Zhongkui Zhu
- Gianfranco Lamperti
- Rong Su
- Chuan Li
- Philippe Dague
- Lei Shu
- Jerzy Tyszer
- Hao Ying
- Marina Zanella
- Marcos Vicente Moreira
Venues
- IEEE Trans. Instrum. Meas.
- IEEE Access
- CoRR
- Sensors
- IEEE Trans. Autom. Control.
- CDC
- ACC
- Autom.
- IEEE Trans. Ind. Informatics
- IEEE Trans. Ind. Electron.
- Discret. Event Dyn. Syst.
- Expert Syst. Appl.
- Entropy
- SMC
- Neurocomputing
- Eng. Appl. Artif. Intell.
- ITC
- ECC
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Computers
- IEEE Trans Autom. Sci. Eng.
- CASE
- IECON
- WODES
- Adv. Eng. Informatics
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- J. Intell. Fuzzy Syst.
- I2MTC
- Knowl. Based Syst.
- ETFA
- Appl. Intell.
- SAFEPROCESS
- Asian Test Symposium
- Appl. Soft Comput.
- IEEE Trans. Control. Syst. Technol.
- IEEE Trans. Fuzzy Syst.
- J. Intell. Manuf.
- ICPHM
- DATE
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