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On the Generation of Diagnostic Test Set for Intra-cell Defects.

Zhenzhou SunAlberto BosioLuigi DililloPatrick GirardArnaud VirazelEtienne Auvray
Published in: ATS (2014)
Keyphrases
  • test set
  • error rate
  • training set
  • test data
  • training data
  • evaluation methodology
  • expert systems
  • class distribution
  • database
  • machine learning
  • multi view
  • training and test sets