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Software-Based Self-Test Techniques for Dual-Issue Embedded Processors.

Paolo BernardiRiccardo CantoroSergio de LucaErnesto SánchezAlessandro SansonettiGiovanni Squillero
Published in: IEEE Trans. Emerg. Top. Comput. (2020)
Keyphrases
  • embedded processors
  • software testing
  • test cases
  • software development
  • single chip
  • software systems
  • test suite
  • color images
  • information systems
  • image analysis
  • source code
  • software architecture