An efficient fault simulation technique for transition faults in non-scan sequential circuits.
Alberto BosioPatrick GirardSerge PravossoudovitchPaolo BernardiMatteo Sonza ReordaPublished in: DDECS (2009)
Keyphrases
- fault diagnosis
- fault detection
- fault models
- fault model
- multiple faults
- analog circuits
- fault isolation
- simulation model
- complex systems
- model based diagnosis
- fault detection and isolation
- data sets
- fault detection and diagnosis
- industrial processes
- discrete event
- simulation environment
- numerical simulations
- mathematical model
- high speed
- expert systems
- knowledge base