Scan-chain intra-cell defects grading.

Aymen Touati Alberto Bosio Luigi Dilillo Patrick Girard Arnaud Virazel Paolo Bernardi Matteo Sonza Reorda

Published in: DTIS (2015)

Keyphrases

defect detection
defect classification
real time
microscopy images
stem cell
database
neural network
expert systems
automated visual inspection
real world
machine learning
information retrieval
image analysis
student learning
quality control
automatic assessment