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An enhanced FPGA-based low-cost tester platform exploiting effective test data compression for SoCs.
Lyl M. Ciganda
Francesco Abate
Paolo Bernardi
M. Bruno
Matteo Sonza Reorda
Published in:
DDECS (2009)
Keyphrases
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test data
test cases
low cost
test set
training data
real time
testing process
data sets
black box
training and test data
high quality
search based testing
feature selection
database systems
image compression
embedded systems