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An effective approach to automatic functional processor test generation for small-delay faults.
Andreas Riefert
Lyl M. Ciganda
Matthias Sauer
Paolo Bernardi
Matteo Sonza Reorda
Bernd Becker
Published in:
DATE (2014)
Keyphrases
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test generation
test cases
mutation testing
test sequences
symbolic execution
functional verification
design automation
software testing
error detection
high speed
data sets
quality assurance
test data generation
static analysis
test suite
computer vision
machine learning