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Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test.
Mauricio de Carvalho
Paolo Bernardi
Ernesto Sánchez
Matteo Sonza Reorda
Oscar Ballan
Published in:
J. Electron. Test. (2014)
Keyphrases
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mobile devices
parallel processing
high end
neural network
functional verification
information systems
decision making
high speed
computer architecture
data sets
wireless sensor networks
processing capabilities