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Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test.

Mauricio de CarvalhoPaolo BernardiErnesto SánchezMatteo Sonza ReordaOscar Ballan
Published in: J. Electron. Test. (2014)
Keyphrases
  • mobile devices
  • parallel processing
  • high end
  • neural network
  • functional verification
  • information systems
  • decision making
  • high speed
  • computer architecture
  • data sets
  • wireless sensor networks
  • processing capabilities