A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors.
Oscar BallanPaolo BernardiB. YazdaniErnesto SánchezPublished in: IOLTS (2013)
Keyphrases
- software testing
- test cases
- testing process
- test suite
- test data generation
- test case generation
- regression testing
- embedded systems
- integration testing
- set of test cases
- test generation
- software reliability
- test data
- quality assurance
- personal computer
- model based testing
- unit testing
- test sequences
- number of test cases
- control software
- software development
- statistical tests
- software systems
- software engineering
- embedded software
- software package
- code coverage
- computer architecture
- usability testing
- software maintenance
- search strategy
- computer systems
- source code
- object oriented
- static analysis
- software tools
- development process
- software architecture
- test set
- exam preparation
- test driven development
- search based software testing