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On the in-field testing of spare modules in automotive microprocessors.
Paolo Bernardi
Sergio de Luca
Davide Piumatti
S. Regis
Ernesto Sánchez
Alessandro Sansonetti
Published in:
VLSI-SoC (2017)
Keyphrases
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image processing
artificial neural networks
response time
functional modules
automotive industry
database
neural network
genetic algorithm
decision making
knowledge base
expert systems
evolutionary algorithm
test cases
personal computer
graduate students
single chip