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Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs.
Egor S. Sogomonyan
Michael Gössel
Published in:
J. Electron. Test. (1993)
Keyphrases
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fault detection
circuit design
fault diagnosis
logic circuits
fault identification
failure detection
industrial processes
decision making
artificial neural networks
management system
test cases
fault isolation
logic synthesis
chip design
robust fault detection